Absolute reflectance measurement at normal incidenceRAM, R. S; PRAKASH, O; SINGH, J et al.Optics and laser technology. 1990, Vol 22, Num 1, pp 51-55, issn 0030-3992Article

Détermination de la réfraction à la verticaleVINOGRADOV, V. V.Geodeziâ i kartografiâ. 1986, Num 7, pp 18-20, issn 0016-7126Article

Generalized nihility media from transformation opticsWEI YAN; MIN YAN; MIN QIU et al.Journal of optics (Print). 2011, Vol 13, Num 2, issn 2040-8978, 024005.1-024005.13Article

Birefringence of interferential mirrors at normal incidence: Experimental and computational studyBIELSA, F; DUPAYS, A; FOUCHE, M et al.Applied physics. B, Lasers and optics (Print). 2009, Vol 97, Num 2, pp 457-463, issn 0946-2171, 7 p.Article

A single measurement approach for the determination of the normal incidence transmission lossBONFIGLIO, Paolo; POMPOLI, Francesco.The Journal of the Acoustical Society of America. 2008, Vol 124, Num 3, pp 1577-1583, issn 0001-4966, 7 p., 1Article

Study of the Bullet Position Measuring Model With Six Light ScreensFENG BIN; SHI, Xiu-Hua; KANG, Zhi-Qiang et al.Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 8191, issn 0277-786X, isbn 978-0-8194-8832-9, 819108.1-819108.7Conference Paper

Characteristic properties of diffraction spectra variations of light interacting with the thick acoustic gratingMYKHAYLOVSKA, A. S; MIKHAYLOVSKAYA, L. V.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7388, issn 0277-786X, isbn 978-0-8194-7671-5 0-8194-7671-4, 73880S.1-73880S.8Conference Paper

Phase resonances in obliquely illuminated compound gratingsDEPINE, Ricardo A; FANTINO, Angela N; GROSZ, Susana I et al.Optik (Stuttgart). 2007, Vol 118, Num 1, pp 42-52, issn 0030-4026, 11 p.Article

Polarization interference effects caused by contrary waves incident on a magnetized layerAFANAS'EV, S. A; SEMENTSOV, D. I.Journal of communications technology & electronics. 1998, Vol 43, Num 8, pp 914-918, issn 1064-2269Article

X-Ray diffraction curves from mosaic crystals at near-normal incidence anglesNAKAHATA, T; HASHIZUME, H; OSHIMA, M et al.Japanese journal of applied physics. 1989, Vol 28, Num 7, pp L1300-L1303, issn 0021-4922, 2Article

Charge-sensitive infrared phototransistors with integrated plasmonic photocouplersZHIHAI WANG; ISHIBASHI, Koji; KOMIYAMA, S et al.Journal of physics. D, Applied physics (Print). 2013, Vol 46, Num 16, issn 0022-3727, 165107.1-165107.6Article

The optical response of single-interface and thin slab dielectric gratingsHOOPER, I. R; SAMBLES, J. R.Journal of optics. A, Pure and applied optics (Print). 2006, Vol 8, Num 4, issn 1464-4258, S250-S26Article

Der Aufprall eines Balles auf eine starre wand = Impact of a ball on a hard wallEIBÖCK, P.Zeitschrift für angewandte Mathematik und Mechanik. 1995, Vol 75, Num 1, pp 85-88, issn 0044-2267Article

Sur la réflexion d'une onde sonore par une frontière inhomogèneLAPIN, A. D.Akustičeskij žurnal. 1984, Vol 30, Num 60, pp 836-838, issn 0320-7919Article

Implementation of normal incidence absorption coefficient for boundary condition of digital Huygens' modelTSUCHIYA, Takao.Acoustical science and technology. 2008, Vol 29, Num 5, pp 326-328, issn 1346-3969, 3 p.Article

Ultrasonic airborne insertion loss measurements at normal incidence (L)FARLEY, Jayrin; ANDERSON, Brian E.The Journal of the Acoustical Society of America. 2010, Vol 128, Num 6, pp 3305-3307, issn 0001-4966, 3 p.Article

'Gedankenspektrum' Methods in Optical CoatingsGOLDSTEIN, Fred T.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7101, pp 710105.1-710105.6, issn 0277-786X, isbn 978-0-8194-7331-8 0-8194-7331-6, 1VolConference Paper

Modeling the effect of finite size gratings on scatterometry measurementsKENYON, Elizabeth; CRESSWELL, Michael W; PATRICK, Heather J et al.Proceedings of SPIE, the International Society for Optical Engineering. 2008, pp 69223P.1-69223P.8, issn 0277-786X, isbn 978-0-8194-7107-9Conference Paper

Resonances of split-ring resonator metamaterials in the near infraredROCKSTUHL, C; ZENTGRAF, T; GUO, H et al.Applied physics. B, Lasers and optics (Print). 2006, Vol 84, Num 1-2, pp 219-227, issn 0946-2171, 9 p.Article

Influence of the surface height distribution on the total integrated scatter (TIS) formulaRAKELS, J. H.Nanotechnology (Bristol. Print). 1996, Vol 7, Num 1, pp 43-46, issn 0957-4484Article

Surface and subsurface fluorometry under normal incidence conditionsXING-ZHENG WU; KITAMORI, T; TERAMAE, N et al.Bulletin of the Chemical Society of Japan. 1991, Vol 64, Num 9, pp 2710-2713, issn 0009-2673Article

High-resolution spectra of laser plasma light sources in the normal incidence XUV regionORTH, F. B; UEDA, K; MCILRATH, T. J et al.Applied optics. 1986, Vol 25, Num 13, pp 2215-2217, issn 0003-6935Article

High-accuracy true normal-incidence absolute reflectometerBITTAR, A; HAMLIN, J. D.Applied optics. 1984, Vol 23, Num 22, pp 4054-4057, issn 0003-6935Article

Integrating photonic crystals in thin film silicon photovoltaicsO'BRIEN, P. G; CHUTINAN, A; OZIN, G. A et al.Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7750, issn 0277-786X, isbn 978-0-8194-8241-9, 77502U.1-77502U.9Conference Paper

Short range scattering of the fundamental shear horizontal guided wave mode normally incident at a through-thickness crack in an isotropic plateRAJAGOPAL, P; LOWE, M. J. S.The Journal of the Acoustical Society of America. 2007, Vol 122, Num 3, pp 1527-1538, issn 0001-4966, 12 p.Article